Advances in X-Ray Analysis: Volume 30 by Donald E. Leyden (auth.), Charles S. Barrett, John V. PDF

By Donald E. Leyden (auth.), Charles S. Barrett, John V. Gilfrich, Ron Jenkins, Donald E. Leyden, John C. Russ, Paul K. Predecki (eds.)

ISBN-10: 1461290759

ISBN-13: 9781461290759

ISBN-10: 1461319358

ISBN-13: 9781461319351

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In addition, the angle of incidence on the specimen is 90 degrees for: the Sandia unit and 45 degrees for the Kevex unit. The nickel signal from a two mil NBS standard Ni on low carbon (1010) steel sample was comparable for both systems using a Ho target X-ray tube. 47 MONTE C. NICHOLS ET AL. Figure 1. Combined Cu and Ni X-ray image of a Cu resolution grid (red) on top of a similar Ni grid (blue). 5 micrometers thick and 15 micrometers wide. The square holes in the Ni and Cu grids are 60 & 230 micrometers wide respectively.

1 "''t (lo n O I '{ ,~ A . .. ~. '. ' ··; ~ ~.. J . ~ T~ . 1' .... Figure 2. Ore deposit thick-section £rcm Gold Hill mining district, Colorado. ge for Pb,Au,Ag,Fe; D = X-ray image for Te. c A • ~,~. Au x oZ »-I Z -I m s:: -I ::0 C o Z en z ~ en m C (5 I Z (") m -I 'TI ::0 '" ~ 43 DALE R. BOEHME same position of the sample and are used for image reference. The depth from which analyte fluorescent x-rays emerge can be calculated for any given instrument geometry by the following equation: where 1/10 = e-(loIpsincp + loIasin~t IoIP = linear absorption coeffiecient of the primary radiation.

It might be considered that the Si(Li) solid state detector, as used in an ED instrument, is a dispersion device. It will be discussed in the next section. DETECTORS The proportional counter (sealed or flow) and the scintillation counter remain the detectors of choice for wavelength dispersion. Some effort is being pursued to develop the gas-proportionalscintillation counter, which is expected to provide better energy resolution. These same detectors are often used in the simplest type of energy dispersion; filters can provide the ability to discriminate against any interference caused by the limited resolving power.

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Advances in X-Ray Analysis: Volume 30 by Donald E. Leyden (auth.), Charles S. Barrett, John V. Gilfrich, Ron Jenkins, Donald E. Leyden, John C. Russ, Paul K. Predecki (eds.)


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